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Decapsulation
SEM&EDX
Probe Station Application
EMMI Application
OBIRCH Application
LC Application
IC Grinding:Positioned/None-positioned
De-Gold Bump
X-Ray Application
SAM Application
EMMI Application
SEM&EDX Application
SEM(Scanning Electron Microscope) / EDX(Energy Dispersive X-Ray) Application
* Material surface morphology
* Precise elemental composition of material
* Precise measurement of device size
* Device failure analysis


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